List of Facilities - 06/22/2009
◇Multifunctional X-ray Photoelectron Spectroscopy(AXIS UTLTRADLD)。
◇Physical Property Measurement System(Model-9)。
◇Field Emission Scanning Electron Microscope(S-4800)。
◇Dimension 3100 Scanning Probe Microscope(Dimension3100V)。
◇X-Ray Diffractometer(D8 Advance)。
◇Accelerated Surface Ar...  
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Field Emission Scanning Electron Microscope(S-4800) - 08/13/2009
FE-SEM is a microscope which tiny structures as small as 1 nanometer(=one millionth of a millimeter=10-9 m!
)can be visualize in small objects.
Image observation is available by selecting secondary and/or backscatter electrons independently or by signal mixing through the use of the proprietary H...  
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Microtrac Particle Size Analyzer(S3500-special) - 07/17/2009
MPSA provides accurate,reliable and repeatable particle size information for applications ranging from research and development to production to process and quality control.
Analysis of scattered light to determine particle size employs a Mie based unified angular scattering theory from large par...  
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Accelerated Surface Area and Porosimetry System(ASAP 2020M) - 07/17/2009
The ASAP 2020 makes it easy to obtain high-quality data for research and quality control applications.
The system contains a multitude of data reduction methods and can be readily upgraded to perform micropore and chemisorption analyses.
All options are designed to be integrated into the ASAP 202...  
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X-Ray Fluorescence Spectrometer(ZSXpimusII) - 07/17/2009
During x-ray fluorescence analysis,high energy x-ray photons produced in the x-ray tube bombarb the sample causing the ejection of electrons from their orbitals.
Fluorescence occurs when energy is given off as outer shell electrons drop down to replace inner shell electrons that have been ejected...  
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